Atomic Force Microscopes

Companies Atomic Force Microscopes

Bruker Nano GmbH, Germany

Bruker Nano is part of the Bruker Group, a leading brand in scientific instrumentation. We are a supplier of instrumentation for micro and nano-scale analysis, providing you with highest quality tools for energy dispersive spectrometry (EDS) on scanning and transmission electron microscopes and atom more

News Atomic Force Microscopes

• Magnetic actuation enables nanoscale thermal analysis
  

  Polymer nano-films and nano-composites are used in a wide variety of applications from food packaging to sports equipment to automotive and aerospace applications. Thermal analysis is routinely used to analyze materials for these applications, but the growing trend to use nanostructured materials ha more

• AFM positioning: Shining light on a needle in a haystack

  The researchers characterize their new technique as a neat solution to the "needle in a haystack" problem of nanoscale microscopy, but it's more like the difference between finding the coffee table in a darkened room either by walking around until you fall over it, or using a flashlight. In a new pa more

• 'White graphene' to the rescue

  What researchers might call "white graphene" may be the perfect sidekick for the real thing as a new era unfolds in nanoscale electronics. But single-atom-thick layers of hexagonal boron nitride (h-BN), the material under intense study at Rice University's world-class Department of Mechanical Engin more

Publications Atomic Force Microscopes

• Role of Interfacial Interaction in Orientation of Poly(N-isopropylacrylamide) Chains on Silicon Substrate.

  Studies of self-assembled PNIPAM films on hydrophilic and hydrophobic substrates that are grown below and above lower critical solution temperature (LCST) have been performed to understand the role of intramolecular and polymer–substrate interactions in self-assembly using near edge X-ray absorption more

• Parameterization of the chaotic surface relief based on atomic-force microscopic data

  An approach to parameterization of the structure of chaotic surfaces was presented which employs the flicker-noise spectroscopic technique for analyzing the atomic-force microscopy data arrays. This approach implies calculation of the surface relief parameters with the use of the information paramet more

• Atomic-force microscopy of nickel nanoparticles possessing electrocatalytic properties

  Surface morphology of highly oriented pyrolytic graphite with electrodeposited nickel nanoparticles was studied by atomic-force microscopy in the presence and absence of ethanol. Voltammetric and atomic-force microscopic data and histograms of particle size distribution were used to evaluate the uni more

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