Powerful All-In-One Electron Microscope with Integrated Element Analysis

In the past, scanning electron microscopes were utterly expensive, room-filling and highly complex systems.

With the introduction of desktop systems about 6 years ago, highly powerful tabletop solutions are now available.

Desktop SEM advantages:

• Enhanced microscopy beyond light optical systems including element analysis
• Great replacement for old electron microscopes that can no longer be maintained
• Decentralized and mobile availability of SEM capacities
• Quick results
• Easy handling
• Saves time in product development and quality control

Phenom Desktop Electron Microscopes Overview

The Phenom G2 pure is an ideal entry-level system at a highly attractive price. It is meant for users who want to use electron microscopy as expansion to their light microscopy options.

The Phenom G2 pro currently is the most powerful desktop SEM on the market with a second-to-none resolution of < 3 nm. Software options like 3D roughness and fiber metric expand surface, fiber and pore analysis options to the sub micrometer range.

The new Phenom proX is the most powerful all-in-one desktop system on the market. It allows fully integrated EDX analysis.

All Phenom desktop SEMs feature a modular design to fit all current or future applications.

Highlights

All-in-One SEM with a patented, intuitive concept of operations

• Touchscreen
• Ultra compact design
• Can be set up in an office
• Built-in motorized X/Y sample control
• Ultrafast, fully automated sample loading in less than 30 seconds
• Integrated navigation camera that records the sample from the same perspective as the SEM. This allows easiest navigation even at maximum magnification.
• Phenom G2 pro und Phenom pro X navigation cameras come as color CCD microscopes with 20x to 120x magnification.

Premium CeB6 cathode with ultra high life time

• A high direction beam value allows low-noise, high-resolution images with low acceleration voltage at all magnifications.
• Especially suited for imaging thin films
• Significant advantages with sensitive samples (organic, polymeres, etc.)

Charge reduction mode

• Charging effects are reduced by fully controlled reduction of vacuum
• Suited for insulation samples like synthetics, organics, etc.
• Reduction of vacuum artefacts
• Life time of electron source not affected by Charge-Reduction-Mode

Premium BSE 4-quadrant semiconductor detector

• High-resolution, low-noise images at low acceleration voltage
• Low noise even in Charge-Reduction-Mode
• Important for organic or insulation samples
• Large field-of-view in SEM mode even with short working distances
• Depth-of-field to 800 µm (depending on working distance)
• Non-reflecting images of polished or shiny surfaces
• Element contrast to distinguish elements and image object shapes
• Topography contrast to image even the finest surface structures

Fully integrated EDX analysis (Phenom pro X only)

• Silicon Drift Detector (SDD) with 25 mm² active area
• Thermoelectric cooling (no need for nitrogen)
• Ultrathin Si₃N₄-window
• Element detection range C ₍₆₎ to Am ₍₉₅₎
• Count rate up to 300.000 cps
• Multi-channel detector with 2048 channels
• Automatic peak identification
• Automatic peak deconvolution
• Measurement reliability indicator

Wide range of accessories

• Charge reduction sample holder
• Cooling stage -25°C to +50°C)
• Tilt & rotation sample holder
• 3D roughness reconstruction to visualize surface topographies
• Fibermetric for fully automated measurement of pores and fibers in the nano scale

For further information please visit our product website, download our product brochure or get in contact with us!