My watch list
my.chemeurope.com  
Login  

This article quantitatively reconciles crystallographic and mechanics approaches to lattice refinement as part of X‐ray diffraction procedures. The equivalence between the refinement based on unit‐cell parameters to that based on a lattice deformation tensor is established from a fixed reference configuration. Justification for the small strain assumption, commonly employed in X‐ray diffraction based stress analysis, is also derived. It is shown that relations based on infinitesimal strains are correct to within an error of quadratic order in strain. This error may be important to consider for high‐precision or high‐strain experiments. It is hoped that these results are of use for facilitating communication and collaboration between crystallography and experimental mechanics communities, for studies where X‐ray diffraction data are the fundamental measurement.

Authors:   Edmiston, J.K.; Bernier, J.V.; Barton, N.R.; Johnson, G.C.
Journal:   Acta Crystallographica Section A
Volume:   68
Issue:   2
Year:   2012
Pages:   181
DOI:   10.1107/S010876731105598X
Publication date:   01-03-2012

Watchlist

This is where you can add this publication to your personal favourites.

Additional Information

Facts, background information, dossiers
More about Wiley
Your browser is not current. Microsoft Internet Explorer 6.0 does not support some functions on Chemie.DE