Sequip - Sensor & Equipment - Solutions for your particle measurement

The insitu PAT Sensor determines particle size and shape of your particle systems continuously in situ under process conditions and in lab. You can increase your product quality by continuous quality control over 24 hours. PAT-Sensors measure emulsion, suspension, dispersphased, biocells, powder, granules and aerosols in original concentration.

The unique dynamic depth focusing provides a broad measurement range from 0.5 to 4000 µm because of continuous changes of the focus depth. By permanent acquisition of the particulate changes, deviations of size, number and shape can be detected at once, representing a major advantage for production control. The Laser Time of Reflection analysis (TOR) added by Sequip in combination with the Sequip Software allows permanent monitoring of possible production variations. The hereby achieved constancy of your products provides safety for your company all the year round.

Products:

Live Particle Sizer Series – beneficial cost/benefit ratio of modular systems:

APAS – Advanced Particle Analysing System

High-End Technology with wide dynamic measuring range from 0,5 up to 4000 µm, detection of roughness, and evaluation with multi capture shape analysis, optical high-end technology and open signal structures

IPAS – Insitu Particle Analysing System

Best price performance ratio for development departments. High-End Technology with wide dynamic measuring range from 0,5 up to 2000 µm for crystals, particles and shape correction.

MCSA – PAT Sensor Multi Capture Analyse

New technology with wide dynamic measuring range from 0,5 up to 4000 µm, detection of roughness, evaluation with multi capture signal analysis,

ECA – Emulsion Characteristic Analyser

Insitu PAT-Sensor for emulsions in original concentration in real time

MSRA – Multi Scattering Radar Analyser

Basic turbidity signals of multi scattered particle systems based on Optical density in front the sensor and their cord length signal

Insitu Video Mikroskop IVM

Inline Image Analysis:

• Detection of real particles and their morphology in real time during crystallization.
• Detection of roughness of surface of every single particle with a high resolution camera system
• Detection of shape parameters

Image Analysis for Lab
500 nano – image analysis of powder with vacuum dispersion from 500 nm
FlowCell – image analysis of suspension and emulsion from 500 nm
Zephyr – image analysis of free–flowing granules from 20 µm up to 5 mm
Pharma – image analysis of toxicological powder

DIPA-2000

Particle size and shape analyser that combines two complementary measurement techniques by integrating laser and video channel.

Powdershape

Particle size measuring of powder and granules with image analysing from 4 µm

Our service:

• Consulting of questions round about particle technology and PAT
• Customized solutions for your particle measurement tasks
• Rent service and user license
• Measuring of your samples by order
• Consulting service – Our specialist will come to you with the instrument and helps to find solutions of your measuring problems.
• Sale – we offer new and used systems

Advantage

• Insitu control of stability of disperse phased systems and suspensions
• Inline process control of particle and droplet sizes in real time 24h/365 days a year
• Online quality control in original concentration
• Highest selectivity and sensitivity under original production conditions
• Dynamic measurement ranges from 0,5 up to 4000 µm
• Measurement in original concentration

The insitu PAT-Systems for particle analysis from 0.5 micron are configurated based on your application. Furthermore we offer you the opportunity to optimize you process and product development with a beneficial cost performance ratio.

Please do not hesitate and contact us! Thank you!