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FEI's Quanta SEMs and Malvern's Advanced Particle Analysis Software Combine to Deliver Solution for Nanoscale Applications

18 Sep 2006 - FEI Company and Malvern Instruments Ltd have entered into a joint development and marketing program for advanced nanoparticle analysis utilizing Malvern's particle image analysis software on FEI's line of Quanta scanning electron microscopes (SEMs). According to the company, the combination delivers a powerful particle analysis solution that extends current analysis technologies for nano-sized particles. Malvern's particle image analysis software will be optimized for FEI's Quanta SEMs. This package is already used on Malvern systems that encompass traditional optical microscopes
 
"As the size of materials used in product development and manufacturing continues to move from the microscale into the nanoscale there is an increasing need for characterization tools that move beyond the limits of light microscopy," commented Matt Harris, FEI's vice president of worldwide marketing and business development. "This combination of FEI and Malvern technologies provides a powerful process and quality control tool for a growing number of nano-enabled products that are moving into production."