Always the right SEM:Characterization of surface structure & elemental analysis for all applications
Looking for a versatile, indispensable tool for your R&D? JEOL‘s SEMs will exceed your expectation!
SEMs ranging from ultrahigh-resolution, high-end field-emission device to easy-entry desk-top unit ✓ Flexible long-life instruments with easy handling, compact dimensions and excellent data acqisition ✓ Efficient and reliable service solutions and customizable accessories (EDS, WDS, EBSD, GatherX, etc) ✓...
analytica
electron microscopes
electron microscopy
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