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13 Current news about the topic scanning electron microscopes

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Microscopy Today Innovation Award for ZEISS microscope

07-Aug-2015

ZEISS MultiSEM 505 has been selected by a team of judges from Microscopy Today magazine as a recipient of the 2015 Microscopy Today Innovation Award.As the first multiple-beam scanning electron microscope (SEM) in the world, the system uses 61 beams simultaneously, and offers a capture speed of ...

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New microscope sees what others can't

12-May-2014

Microscopes don't exactly lie, but their limitations affect the truths they can tell. For example, scanning electron microscopes (SEMs) simply can't see materials that don't conduct electricity very well, and their high energies can actually damage some types of samples. In an effort to extract a ...

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Low-resistance connections facilitate multi-walled carbon nanotubes for interconnects

02-Nov-2012

Using a new method for precisely controlling the deposition of carbon, researchers have demonstrated a technique for connecting multi-walled carbon nanotubes to the metallic pads of integrated circuits without the high interface resistance produced by traditional fabrication techniques.Based on ...

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Scientists home in on lithium battery safety flaws

18-May-2010

Scientists at Cambridge have developed a simple, accurate way of "seeing" chemistry in action inside a lithium-ion battery. By helping them understand how these batteries behave under different conditions the new method – which involves Nuclear Magnetic Resonance (NMR) spectroscopy – could help ...

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UCR scientists manipulate ripples in graphene, enabling strain-based graphene electronics

Study is first to experimentally quantify thermal contraction of graphene

28-Jul-2009

Graphene is nature's thinnest elastic material and displays exceptional mechanical and electronic properties. Its one-atom thickness, planar geometry, high current-carrying capacity and thermal conductivity make it ideally suited for further miniaturizing electronics through ultra-small devices ...

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Canadian research team reports major breakthrough in lithium battery technology

26-May-2009

An NSERC-funded lab at the University Of Waterloo has laid the groundwork for a lithium battery that can store and deliver more than three times the power of conventional lithium ion batteries. The research team of professor Linda Nazar, graduate student David Xiulei Ji and postdoctoral fellow ...

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Researchers find better way to manufacture fast computer chips

06-Apr-2009

Engineers at Ohio State University are developing a technique for mass producing computer chips made from the same material found in pencils. Experts believe that graphene -- the sheet-like form of carbon found in graphite pencils -- holds the key to smaller, faster electronics. It might also ...

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UK scientists help museum curators to determine Viking trade routes by the metal in their swords

07-Jan-2009

Scientists at the National Physical Laboratory (NPL) in Teddington have worked with the Wallace Collection to analyse the contents of Viking swords – and the results shed new light on trade routes in the middle ages. Curators at the collection were researching the steel structure of ancient ...

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NIST studies how new helium ion microscope measures up

08-Sep-2008

Just as test pilots push planes to explore their limits, researchers at the National Institute of Standards and Technology (NIST) are probing the newest microscope technology to further improve measurement accuracy at the nanoscale. Better nanoscale measurements are critical for setting standards ...

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FEI's Quanta SEMs and Malvern's Advanced Particle Analysis Software Combine to Deliver Solution for Nanoscale Applications

18-Sep-2006

FEI Company and Malvern Instruments Ltd have entered into a joint development and marketing program for advanced nanoparticle analysis utilizing Malvern's particle image analysis software on FEI's line of Quanta scanning electron microscopes (SEMs). According to the company, the combination ...

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