Measure Particle Size Distribution by Laser Diffraction - With Just 2 Clicks From 10 nm to 3,500 µm

The Top 3 Advantages of the Product

Particle size analyzer for real particle detection and size analysis down to 10 nm


More precise detection of raw data and greater detector sensitivity for sub-μm particle size analysis


Optimized and intuitive software requires only two clicks from measurement start to result

Best-in-class data lets you detect smaller differences in the samples faster & more reliably

The LS 13 320 XR Particle Size Analyzer from Beckman Coulter boosts laser diffraction particle size analysis to a new level. The enhanced PIDS technology and an expanded measurement range provide higher resolution and more accurate, reproducible results when determining particle sizes. The raw data is detected with greater precision and the detector sensitivity has been increased for sub-μm particle size analysis, providing you with best-in-class data on particle size distribution. This allows you to measure a wider range of particles and detect smaller differences in samples faster and more reliably.

The user interface of the instrument’s intuitive software allows you to get the data you need with just a few clicks – all 21 CFR Part 11 compliant, of course, and therefore perfect for particle size analysis under certified conditions. The particle size analyzer also provides automatic pass/fail visualization for immediate Quality Control (QC) and GMP-compliant tools for Installation Qualification (IQ) and Operational Qualification (OQ).

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