
GC/MS accessories: DIP für GC/MS und LC/MS
Direct analyses with GC/MS or LC/MS by Agilent, Shimadzu, LECO and Bruker
SIM Scientific Instruments Manufacturer GmbH
mass spectra of liquid and solid samples without sample preparation, without chromatography
fast switching from DIP-MS to GC/MS or LC/MS measurements via software, no hardware modification
full automation with autosampler for screenings and quality control








mass spectra without time-consuming sample preparation and chromatography
SIM developed a Direct Inlet Probe system (DIP) for mass spectrometers by Agilent, Shimadzu, LECO and Bruker. Both liquid and solid samples can now be analyzed directly, allowing to achieve mass spectra without sample preparation and chromatographic separation. Depending on the MS instrument, different ionization techniques are available, EI/CI for GC/MS systems and ESI/APCI/APPI for LC/MS systems. The software allows fast and easy switching between the measuring modes with and without chromatography, the chromatography system is not modified. The throughput can be optimized by full automation with a PAL autosampler - ideal for screenings e.g. in the pharmaceutical sector, quality control in chemistry, petrochemistry and food analysis. The direct-inlet system is equipped with a temperature-programmable push rod tip with which the analyte is vaporized directly into the ion source and then the mass spectrum is recorded. This makes it possible to get time-shifted mass spectra of components with different boiling points and enables a partial separation without prior chromatography.

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Direct Inlet Probe for Agilent TQ GC/MS

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Direct Inlet Probe on the complete system with Agilent 5977 GC/MSD, PAL-Autosampler and IMS (G.A.S.)

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Direct Inlet Probe for Shimadzu GC/MS

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Direct Inlet Probe for LECO Pegasus GC-HRT TOFMS
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GC/MS accessories: DIP für GC/MS und LC/MS
Direct analyses with GC/MS or LC/MS by Agilent, Shimadzu, LECO and Bruker