Providing superior energy resolution and light element performance, the Pathfinder X-ray Microanalysis system includes advanced electronics, the sharpest EDS resolution, and spectral-based phase mapping using Principal Component Analysis.
- Fully integrated WDS X-ray Spectroscopy and Electron Backscatter Diffraction
- Spectral Imaging Data Model
- Genuine spectral-based phase mapping using Principal Component Analysis with our patented* Thermo Scientific™ COMPASS™ software
- Ultra-fast electronics and active noise cancellation for superior spectral quality
- Complete range EDS detectors with the largest possible solid angle
- New solid-state Compact EDS detector with excellent EDS performance in a small footprint
- Cleanest, brightest and most accurate element maps on SEM/TEM with Quantitative Mapping
* COMPASS - US Patent US6584413"