Rapid and Efficient Trace Element Analysis with TXRF Spectroscopy

S4 T-STAR®- Automatic measurements without sample digestion, daily calibration or gas consumption

S4 T-STAR® is a new and unique total reflection X-ray fluorescence (TXRF) spectrometer for ultra-trace element analysis in a broad range of application fields, including pharma, food and environmental monitoring. The S4 T-STAR was specifically designed 

  • For new product development and quality control in the food industry
  • To meet new EU and US Pharmacopeia standards in pharmaceutical production
  • For control of contaminants in wastewater, slurries and effluents
  • For chemical analysis and material research at universities or public research facilities

The S4 T-STAR features up to three different X-ray excitation modes and a high performance, large area XFlash® silicon drift detector (SDD) to ensure extremely low limits of detection for all elements from sodium to uranium.

The automatic sample changer offers a total capacity of up to ninety samples. Depending on the application, dedicated trays are available for different kinds of reflective sample carriers, such as quartz discs, microscope slides, or silicon wafers. This unique flexibility, in combination with very modest requirements on sample preparation, make the S4 T-STAR a most versatile tool for the analysis of a multitude of sample types, including solutions, suspensions, solids, wafers, cell cultures, smears and thin sections.

The unique SampleCare™ concept of the S4 T-STAR, featuring a reduced internal air flow, a special integrated sample housing and stackable storage boxes, constantly protects the samples from contamination during preparation, transport and measurement to preserve highest data quality.

The S4 T-STAR is designed for continuous 24/7 multi-user operation in industrial routine analysis and supports automated batch processing as well as unattended operation. It is also the first TXRF spectrometer that automatically runs QC routines in the background, utilizing internal QA samples to monitor and stabilize crucial system parameters.

With significant improvements in detection limits, combined with automatic QC routines, powerful software options, and the unique versatility in terms of sample types and carriers, the S4 T-STAR sets new standards in performance, automation and quality of benchtop TXRF spectrometry and can be considered an efficient complement, or a real alternative, to ICP-OES or ICP-MS.

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