XPS System with Integrated Techniques-Nexsa XPS System

Fully Automated and Compact System, High Throughput and Research Grade Results

The Thermo Scientific™ Nexsa™ XPS System offers fully automated multi-technique analysis along with high throughput without sacrificing research grade results. Integration of multiple analytical techniques like ISS, UPS, REELS and Raman, allows users to conduct true correlative analysis, unlocking the potential for further advances in microelectronics, ultra thin films, nanotechnology development and many other applications.

Material Analysis and Development

Nexsa spectrometer delivers flexibility to maximize the potential of your material. Flexibility in the forms of multiple-integrated technique options for true correlative data analysis and high throughput while maintain research quality results.

Product Features:

  • Insulator Analysis
  • High Performance Spectroscopy
  • Depth Profiling
  • Multi-technique Integration
  • Dual-mode ion source for expanded depth profiling capabilities
  • Tilt Module for ARXPS measurements
  • Avantage Software for for instrument control, data processing, and reporting
  • Small spot analysis


  • Glass coatings
  • Polymers
  • Batteries
  • Graphene
  • Solar cells
  • OLEDs
  • Metals & oxides
  • Bio-surfaces
  • Thin Films
  • Semiconductors
  • Ceramics
  • Catalysts
  • Nanomaterials

Optional Upgrades:

  • RAMAN: Spectroscopic technique used to in chemistry to provide a structural fingerprint
  • ISS: Ion scattering spectroscopy is a technique in which a beam of ions is scattered by a surface
  • UPS: Ultra-violet photoelectron spectroscopy refers to the measurement of kinetic energy spectra of photoelectrons emitted by molecules which have absorbed ultraviolet photons, in order to determine molecular orbital energies in the valence region
  • REELS: Reflected electron energy loss spectroscopy provides information on electronic structure and can measure the presence of hydrogen

SnapMap Feature

Bring sample features into focus with SnapMap's optical view. The optical view helps you pint point areas of interest quickly while developing a fully focused XPS image to further define your experiment.

1. X-rays illuminate a small area on the sample.

2. Photo electrons from that small area are collected and focused into the analyzer

3. Spectra are continually acquired as the stage is moving

4. Stage position monitored throughout data acquisition, positions used to generate SnapMap

  • X-ray photoelectron spectrometer systems

  • XPS spectrometers

  • nanotechnology

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