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Sensors, Vol. 17, Pages 1800: A Multiscale Material Testing System for In Situ Optical and Electron Microscopes and Its Application

Sensors, Vol. 17, Pages 1800: A Multiscale Material Testing System for In Situ Optical and Electron Microscopes and Its Application

Sensors doi: 10.3390/s17081800

Authors: Xuan Ye Zhiguo Cui Huajun Fang Xide Li

We report a novel material testing system (MTS) that uses hierarchical designs for in-situ mechanical characterization of multiscale materials. This MTS is adaptable for use in optical microscopes (OMs) and scanning electron microscopes (SEMs). The system consists of a microscale material testing module (m-MTM) and a nanoscale material testing module (n-MTM). The MTS can measure mechanical properties of materials with characteristic lengths ranging from millimeters to tens of nanometers, while load capacity can vary from several hundred micronewtons to several nanonewtons. The m-MTM is integrated using piezoelectric motors and piezoelectric stacks/tubes to form coarse and fine testing modules, with specimen length from millimeters to several micrometers, and displacement distances of 12 mm with 0.2 µm resolution for coarse level and 8 µm with 1 nm resolution for fine level. The n-MTM is fabricated using microelectromechanical system technology to form active and passive components and realizes material testing for specimen lengths ranging from several hundred micrometers to tens of nanometers. The system’s capabilities are demonstrated by in-situ OM and SEM testing of the system’s performance and mechanical properties measurements of carbon fibers and metallic microwires. In-situ multiscale deformation tests of Bacillus subtilis filaments are also presented.

Authors:   Ye, Xuan ; Cui, Zhiguo ; Fang, Huajun ; Li, Xide
Journal:   Sensors
Volume:   17
edition:   8
Year:   2017
Pages:   1800
DOI:   10.3390/s17081800
Publication date:   04-Aug-2017
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