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A Novel Sample Preparation Method for Ultra-High Vacuum (UHV) Secondary Ion Mass Spectrometry (SIMS) Analyses

Secondary ion mass spectrometry (SIMS) has been applied to analyze a wide range of material for earth science research due to its high sensitivity, high precision and capacity for in-situ micro-analyses. This technique operates under ultra-high vacuum (UHV) conditions, especially for water content measuremen

Authors:   wanfeng zhang; Xiaoping XIA; Yanqiang Zhang; Touping Peng; Qing Yang
Journal:   Journal of Analytical Atomic Spectrometry
DOI:   10.1039/C8JA00087E
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