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Anodic dissolution growth of metal–organic framework HKUST-1 monitored via in situ electrochemical atomic force microscopy

In situ electrochemical atomic force microscopy (ec-AFM) is utilised for the first time to probe the initial stages of metal–organic framework (MOF) coating growth via anodic dissolution. Using the example of the Cu MOF HKUST-1, real time surface analysis is obtained that supports and verifies many of the reaction

Authors:   Stephen D. Worrall; Mark A. Bissett; Martin P. Attfield; Robert A. W. Dryfe
Journal:   CrystEngComm
DOI:   10.1039/C8CE00761F
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