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Particle Characterization

Companies Particle Characterization

Fritsch GmbH, Germany

FRITSCH is one of the internationally leading manufacturers of application-oriented laboratory instruments for sample preparation and particle sizing. Here a short view of the FRITSCH instrument ranges: - Mills for crushing, micro-milling, mixing, homogenising of hard-brittle, fibrous, elasti more

Sympatec GmbH, Germany

Sympatec develops, manufactures, sells, services and supports an innovative range of best instruments for particle size and shape analysis in laboratory and process for customers worldwide. With continuous innovations in the technological fields of laser diffraction, dynamic image analysis, ultraso more

LUM GmbH, Germany

Producer for analytical devices for dispersion analysis and particle characterization, dispersion stability against separation phenomena; shelf life prediction, contract research and analysis, world-wide sales more

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Products Particle Characterization

Particle Size and Stability Analysis of Opaque Suspensions and Emulsions

The application of cross-correlation technology allows the calculation of particle size distribution by eliminating the effect of multiple scattering more

Analysis of particle size and particle shape in laboratory and process from below 1 µm to 34,000 µm

Size and shape distribution: Sympatec image analysers discover the composition of your powders, fibres or liquid samples more

In- and On-Line Particle Size Distribution Analysis in Highly Concentrated Suspensions and Emulsions

Real time particle size distribution and volume concentration analysis of disperse phases in suspensions and emulsions in process environments more

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News Particle Characterization

  • International conference in May celebrates 25th anniversary of LUM GmbH in Berlin

    LUM GmbH is a leading international provider of innovative measurement technology for dispersion analysis and materials testing. Since the founding of the company by Prof. Dr. Dr. D. Lerche in 1994, LUM is also obliged to science. The company promotes science and technology and contributes by own re more

  • Anton Paar acquires Quantachrome Instruments

    Quantachrome and Anton Paar finished the purchasing process on February 9 at the Quantachrome headquarters in Boynton Beach, Florida. The companies agreed not to disclose the purchase price. Under the umbrella of the Anton Paar Group, the company will continue operations in Boynton Beach. Georg Cort more

  • Anton Paar acquires product line for particle characterization

    Anton Paar expands the product portfolio for particle characterization by the acquisition of the corresponding division from CILAS (Orléans, France). The PSA instruments are based on the light scattering principle or image analysis. They give information about the size distribution and shape of part more

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Videos Particle Characterization

Particle Analysis at the Touch of a Button

Anton Paar now introduces particle characterization via light-scattering technology, realized in a system with ingeniously simple software. You can count on state-of-the-art particle analysis at the touch of a button. The Litesizer™ 500 is a high-performance light-scattering instrument with highly s more

Morphologi 4 Range - Automated Imaging for Advanced Particle Characterization

Morphological imaging is fast becoming an essential technology in the laboratory toolkit for particle characterization.  The Morphologi 4 is a fully automated static image analysis system which provides a complete detailed description of the morphological properties of particulate materials. The Mor more

Particle size distribution? Keep it simple! Compact laser particle size analyzer with extra wide measuring range

Select the Laser Particle Sizer according to your needs: either the ANALYSETTE 22 NeXT Micro for all typical measurement tasks from 0.5 - 1500 μm or the high-end instrument ANALYSETTE 22 NeXT Nano with an extra wide measuring range from 0.01 - 3800 μm for maximum precision and sensitivity even for s more

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White papers Particle Characterization

Publications Particle Characterization

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