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2 Current news about the topic particle shape analysis
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Anton Paar acquires product line for particle characterization
08-Jun-2017
Anton Paar expands the product portfolio for particle characterization by the acquisition of the corresponding division from CILAS (Orléans, France). The PSA instruments are based on the light scattering principle or image analysis. They give information about the size distribution and shape of ...
Malvern launches new generation image analysis system for particle shape measurement
07-Mar-2005
Malvern Instruments has launched a new generation image analysis system for the fully automated characterization of particle shape and size. Particle shape analysis has become a critical parameter in many industrial processes. This has fuelled a demand for increasingly flexible analytical systems ...
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