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2 Current news about the topic particle shape analysis

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Anton Paar acquires product line for particle characterization

08-Jun-2017

Anton Paar expands the product portfolio for particle characterization by the acquisition of the corresponding division from CILAS (Orléans, France). The PSA instruments are based on the light scattering principle or image analysis. They give information about the size distribution and shape of ...

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Malvern launches new generation image analysis system for particle shape measurement

07-Mar-2005

Malvern Instruments has launched a new generation image analysis system for the fully automated characterization of particle shape and size. Particle shape analysis has become a critical parameter in many industrial processes. This has fuelled a demand for increasingly flexible analytical systems ...

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