Fully automated, multi-technique surface analysis system to advance your research

Efficient workflows with XPS, UPS, ISS, REELS and Raman spectroscopy

Fast, efficient XPS and other spectroscopies: High sensitivity spectroscopy for small area analysis ✓ Software: Avantage software for data collection, analysis and correlation with electron microscopy ✓ In situ sample processing: NX heater and bias module for advanced experiments ✓...