The traditional use of X-ray fluorescence analysis (XRF) has its roots in geology. Solid samples were the first sample types analyzed by X-rays. Over the years the applications have ex-panded and nowadays cover the analysis of alloys, various types of powder samples to liquid samples and filter material.
The effect of X-ray fluorescence is based on the excitation of atoms in the sample. Unlike optical spectroscopy, the excitation involves interaction with the inner shell electrons rather than valence electrons.
This white paper presents an easy-to-understand introduction into the physics and the technology of an XRF analyzer.