The Thermo Scientific Nexsa G2 Surface Analysis System was used to chemically locate and characterize two-dimensional boron nitride (BN) flakes directly grown onto Cu foil using co-incidental XPS+Raman analysis. By using XPS chemical mapping, the location of the flakes was quickly found. XPS spectroscopy could then be used to deliver high-resolution chemical fingerprinting. Using co-incident Raman spectroscopy, the crystal lattice structure of the 2D boron nitrides was determined to be hexagonal.
These measurements show how a user can chemicallylocate the discrete features using the XPS chemical mapping and investigate the chemical and structural properties using XPS+Raman co-incidental analysis workflow of Nexsa G2 system.