Dr. Paul Mack, Senior Application Scientist

Fully automated, multi-technique surface analysis system to advance your research

Fast and efficient coincident XPS+Raman characterization for correlative analysis

The Thermo Scientific Nexsa G2 Surface Analysis System was used to chemically locate and characterize two-dimensional boron nitride (BN) flakes directly grown onto Cu foil using co-incidental XPS+Raman analysis. By using XPS chemical mapping, the location of the flakes was quickly found. XPS spectroscopy could then be used to deliver high-resolution chemical fingerprinting. Using co-incident Raman spectroscopy, the crystal lattice structure of the 2D boron nitrides was determined to be hexagonal.

These measurements show how a user can chemicallylocate the discrete features using the XPS chemical mapping and investigate the chemical and structural properties using XPS+Raman co-incidental analysis workflow of Nexsa G2 system.

Facts, background information, dossiers
  • thin film analysis
  • 2D-materials
  • ESCA
  • Raman
  • XPS
  • electron spectroscopy
  • metal analysis
  • oxide analysis
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