Philips Analytical's new high-speed X-ray detector offers a quantum leap in recording speed
06-Mar-2001
Philips Analytical announces a new fast X-ray detector - the
X'Celerator - offering an amazing 100-fold increase in recording
speed for powder diffractometry with no compromise on resolution.
Revolutionary technology
Designed for the X'Pert PRO diffractometer series, Philips
Analytical's X'Celerator is based on the company's new RTMS
(Real Time Multiple Strip) detection technology. This, in effect,
replaces a single detector by an integrated array of parallel
detectors to provide up to 100-fold increase in efficiency compared
with traditional detectors. This means a scan formerly requiring
three hours of data collection time can now be recorded in less than
two minutes. Philips Analytical's revolutionary new technology,
moreover, allows these dramatic increases in recording speed with
no compromise on resolution, in contrast to 'fast' detectors offered
by other manufacturers.
“The X'Celerator represents a major step forward for X-ray
diffractometry,” explained Martijn Fransen, x-ray diffraction Product
Specialist at Philips Analytical, Almelo, The Netherlands. “Whereas
past developments in, for example, X-ray optics and in improved
detector efficiency resulted in speed increases of around three to
four, the dramatic increases in recording speed that we're seeing
with the X'Celerator can only be described as a quantum leap.
Laboratory managers, in particular, will appreciate the higher
throughput and lower costs this is bound to lead to.”
The new unit is mounted using the company's proprietary PreFIX
interface - a unique Philips design that allows for easy exchange of
optical components without laborious re-alignment procedures.
Moreover, its state-of-the-art design makes for simple,
maintenance-free operation. The X'Celerator is available with
several options, including a diffracted beam monochromator, a beta
filter and exchangeable Soller slits.
With its high speed and ultra-high resolution, the X'Celerator is
expected to offer major advantages and laboratory cost savings in
almost every powder-diffractometry application such as phase
identification and quantification, crystallography and residual stress
analysis.
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