Philips Analytical's new high-speed X-ray detector offers a quantum leap in recording speed

06-Mar-2001
Philips Analytical announces a new fast X-ray detector - the X'Celerator - offering an amazing 100-fold increase in recording speed for powder diffractometry with no compromise on resolution. Revolutionary technology Designed for the X'Pert PRO diffractometer series, Philips Analytical's X'Celerator is based on the company's new RTMS (Real Time Multiple Strip) detection technology. This, in effect, replaces a single detector by an integrated array of parallel detectors to provide up to 100-fold increase in efficiency compared with traditional detectors. This means a scan formerly requiring three hours of data collection time can now be recorded in less than two minutes. Philips Analytical's revolutionary new technology, moreover, allows these dramatic increases in recording speed with no compromise on resolution, in contrast to 'fast' detectors offered by other manufacturers. “The X'Celerator represents a major step forward for X-ray diffractometry,” explained Martijn Fransen, x-ray diffraction Product Specialist at Philips Analytical, Almelo, The Netherlands. “Whereas past developments in, for example, X-ray optics and in improved detector efficiency resulted in speed increases of around three to four, the dramatic increases in recording speed that we're seeing with the X'Celerator can only be described as a quantum leap. Laboratory managers, in particular, will appreciate the higher throughput and lower costs this is bound to lead to.” The new unit is mounted using the company's proprietary PreFIX interface - a unique Philips design that allows for easy Exchange of optical components without laborious re-alignment procedures. Moreover, its state-of-the-art design makes for simple, maintenance-free operation. The X'Celerator is available with several options, including a diffracted beam monochromator, a beta filter and exchangeable Soller slits. With its high speed and ultra-high resolution, the X'Celerator is expected to offer major advantages and laboratory cost savings in almost every powder-diffractometry application such as phase identification and quantification, crystallography and residual stress analysis.

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