Anasys Instruments receives Microscopy Today’s 2011 Innovation Award for their AFM-IR platform
19-Aug-2011 -
Anasys Instruments’ AFM-IR system has been recognized by Microscopy Today in the receipt of the 2011 Innovation Award. It was presented to CEO, Roshan Shetty, at the 2011 M&M Annual conference held this year in Nashville, TN.
The AFM-IR technique was developed by Dr. Alexandre Dazzi at the ...
atomic force microscopy
infrared spectroscopy
spectroscopy