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Next Generation DLS Instrument with the Novel Polarisation-separated Backscatter PCCS | NANOPHOX CS

Enhance Lab Productivity with the E-Series Flow Chemistry System

Next generation quantitative gas analysis system

Fast results. Maximum automation. Minimal training required. JEOL scanning electron microscopes

Optimized workflows, integrated EDS analysis and 3D reconstruction for beginners to professionals

Resolution up to 0.5 nm at 15 kV (JSM-IT-810) for highly detailed structural analysis ✓ Sample current ≥ 500 nA (JSM-IT810 SHL) for extremely fast analysis ✓ Fully automatic image capture and particle analysis saves up to 80% of working time ✓...

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FT-IR microscopy in the fast lane - the LUMOS II

One infrared microscope for all

Our focus: highest data quality and measurement speed ✓ Simple operating concept: users are trained in minutes ✓ Smart sustainability: does not require any costly consumables ✓...

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Inspiring simple inspection

Inspect with a single system

Save time with quick sample identification ✓ Measure and annotate directly during visual inspection without a PC ✓ Get crisp images with less manual effort ✓...

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Inverted Microscope for Industrial Applications Leica DMi8

See more of your sample

Switch from macro (35 mm) to nano (1 nm) with one click ✓ See more details with unique UC-3D illumination ✓ Intuitive handling for faster work ✓...

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DON'T SEARCH. FIND!

Fast, reliable, and easy to use

Explore in a flexible way ✓ Investigate your samples with ease ✓ Rely on your results ✓...

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See More, Detect Faster

High-throughput Inspection Systems

Design prevents dust accumulation, currents, ensuring clean analysis and inspection chambers ✓ Maximum lateral resolution with 150X UV lens ✓ The 0.7X USP objective allows you to see a larger field, reducing analysis time ✓...

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Upright Material Microscope

All Set and remembered

Motorized high precision 2-gear focus drive ✓ Motorized 6-fold or 7-fold objective nosepiece ✓ Leica DM6 M + software = ideal inspection system for accuracy and repeatability ✓...

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Apreo 2 SEM: Scanning Electron Microscope with Impressive Resolution Specifications

Unmatched versatility powered by ChemiSEM Technology

High-performance SEM for nanometer or sub-nanometer resolution performance on materials ✓ Extreme flexibility for a wide range of sample types, including insulators, sensitive materials etc ✓ Less time spent on maintenance with an optics system that aligns itself (SmartAlign Technology) ✓...

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Scanning electron microscopy: Flexible systems for research and industry

From benchtop devices to FEG-SEM: customised solutions for precise analyses

SEMs ranging from ultrahigh-resolution, high-end field-emission device to easy-entry desk-top unit ✓ Flexible long-life instruments with easy handling, compact dimensions and excellent data acqisition ✓ Efficient and reliable service solutions and customizable accessories (EDS, WDS, EBSD, GatherX, etc) ✓...

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Buy Microscopes For Failure Analysis

Buy Microscopes For Failure Analysis

Fast results. Maximum automation. Minimal training required. JEOL scanning electron microscopes