Buy Products For Surface Analytics
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Buy Products For Surface Analytics
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Mütek™ SZP-16 by BTG
The Standard for Lab Zeta Potential Measurement
Unlock the Zeta Potential and Say Goodbye to Guesswork
Immediate insights into fiber charges without complex sample preparation ✓ Optimized chemical dosing for cost savings and quality improvement ✓ Precise monitoring of additive effectiveness on fibers and fillers ✓
OCA 200 by DataPhysics
Using contact angle meter to comprehensively characterise wetting behaviour, solids, and liquids
With its intuitive software and as a modular system, the OCA 200 answers to all customers’ needs
Modular device can be fitted perfectly to almost all measuring needs ✓ Measure contact angle of up to 30 picolitre small drops on small as well as on large-scale solids ✓ Newly developed software offers smart user guidance, live analysis and instant replay functions ✓
ZPA 20 by DataPhysics
Zeta Potential Analyzer for Solid Surfaces
Powders, fibers & flat samples: Electrochemical analysis helps understanding surface interactions
Patented technology: oscillatory streaming potential measurement for highly accurate results ✓ Transparent measuring cells: fillable with high reproducibility & easy-to-clean ✓ Quick results: single measurements and automated titrations for isoelectric point ✓
LUMOS II by Bruker
FT-IR microscopy in the fast lane - the LUMOS II
One infrared microscope for all
Our focus: highest data quality and measurement speed ✓ Simple operating concept: users are trained in minutes ✓ Smart sustainability: does not require any costly consumables ✓
witec360 Raman Imaging Mikroskop by WITec
3D Raman microscopes with unequalled speed, sensitivity and resolution
Visualize and characterize every chemical detail
Maximized signal intensity for the broadband range from 350 - 1100 nm excitation ✓ Maximise efficiency and simplify your workflows with advanced automation options ✓ Intelligent automation features lead to a higher productivity and sample turnover ✓
oscas by LabCognition
Spectroscopy Apps for Routine Spectrum Analysis
Increase sample throughput, avoid errors and save ressources
Standardised apps - fully functional even in offline-mode ✓ oscas cloud - central data storage and cross-lab management ✓ Combi solution - manufacturer-independent device connection ✓
JEOL SEM Series by JEOL
Scanning electron microscopy: Flexible systems for research and industry
From benchtop devices to FEG-SEM: customised solutions for precise analyses
SEMs ranging from ultrahigh-resolution, high-end field-emission device to easy-entry desk-top unit ✓ Flexible long-life instruments with easy handling, compact dimensions and excellent data acqisition ✓ Efficient and reliable service solutions and customizable accessories (EDS, WDS, EBSD, GatherX, etc) ✓
NEXSA by Thermo Fisher Scientific
Fully automated, multi-technique surface analysis system to advance your research
Efficient workflows with XPS, UPS, ISS, REELS and Raman spectroscopy
Fast, efficient XPS and other spectroscopies: High sensitivity spectroscopy for small area analysis ✓ Software: Avantage software for data collection, analysis and correlation with electron microscopy ✓ In situ sample processing: NX heater and bias module for advanced experiments ✓
DCAT by DataPhysics
High precision tensiometer for surface and interface analysis
Modular, extendable, powerful - ideal for laboratory and research
Modular tensiometer – extensions like temperature chamber and Langmuir trough available ✓ Camera module allows image-weight correlation to determine adhesive force per unit area ✓ Dosing unit with up to four syringes for an efficient automatic measurement of the CMC ✓
MSA One-Click SFE by KRÜSS
MSA One-Click SFE
Analyzing wettability in a second with only one click
Fully automatic measurement of contact angle and surface free energy in one second ✓ User-independent results thanks to the reliable and predefined measurement sequence ✓ Measurement on large workpieces and finished products such as car bodies, aircraft parts or walls ✓
Choose products by product category
OCA 200 by DataPhysics
Using contact angle meter to comprehensively characterise wetting behaviour, solids, and liquids
With its intuitive software and as a modular system, the OCA 200 answers to all customers’ needs
NEXSA by Thermo Fisher Scientific
Fully automated, multi-technique surface analysis system to advance your research
Efficient workflows with XPS, UPS, ISS, REELS and Raman spectroscopy
MSA One-Click SFE by KRÜSS
MSA One-Click SFE
Analyzing wettability in a second with only one click
DCAT by DataPhysics
High precision tensiometer for surface and interface analysis
Modular, extendable, powerful - ideal for laboratory and research
Buy products for Surface analytics from these suppliers
Buy products for the lab or the production process
OCA 200 by DataPhysics
Using contact angle meter to comprehensively characterise wetting behaviour, solids, and liquids
With its intuitive software and as a modular system, the OCA 200 answers to all customers’ needs
Mütek™ SZP-16 by BTG
The Standard for Lab Zeta Potential Measurement
Unlock the Zeta Potential and Say Goodbye to Guesswork
LUMOS II by Bruker
FT-IR microscopy in the fast lane - the LUMOS II
One infrared microscope for all
witec360 Raman Imaging Mikroskop by WITec
3D Raman microscopes with unequalled speed, sensitivity and resolution
Visualize and characterize every chemical detail
ZPA 20 by DataPhysics
Zeta Potential Analyzer for Solid Surfaces
Powders, fibers & flat samples: Electrochemical analysis helps understanding surface interactions
Panorama by LabCognition
30-Day Free Trial: Software for Calculating Characteristic Color Values from UV/Vis Spectra
Your ideal companion in forensic, surface, painting, coating and damage analysis
oscas by LabCognition
Spectroscopy Apps for Routine Spectrum Analysis
Increase sample throughput, avoid errors and save ressources
Tensíío by KRÜSS
Break-through in tensiometry
One device, 15 methods for analyzing surface and interfacial tension and wettability
NEXSA by Thermo Fisher Scientific
Fully automated, multi-technique surface analysis system to advance your research
Efficient workflows with XPS, UPS, ISS, REELS and Raman spectroscopy
JEOL SEM Series by JEOL
Scanning electron microscopy: Flexible systems for research and industry
From benchtop devices to FEG-SEM: customised solutions for precise analyses
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