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Scanning voltage microscopy
Additional recommended knowledge
SVM is particularly well suited to analyzing microelectronic devices (such as transistors or diodes) or quantum electronic devices (such as quantum well diode lasers) directly because nanometer spatial resolution is possible. SVM can also be used to verify theoretical simulation of complex electronic devices.
For example, the potential profile across the quantum well structure of a diode laser can be mapped and analyzed; such a profile could indicate the electron and hole distributions where light is generated and could lead to improved laser designs.
In a similar technique, Scanning Gate Microscopy (SGM), the probe is oscillated at some natural frequency some fixed distance above the sample with an applied voltage relative to the sample. The image is constructed from the X,Y position of the probe and the conductance of the sample, with no significant current passing through the probe, which acts as a local gate. The image is interpreted as a map of the sample's sensitivity to gate voltage. A lock-in amplifier aids noise reduction by filtering through only the amplitude oscillations that match the probe's vibration frequency. Applications include imaging defect sites in carbon nanotubes and doping profiles in nanowires.
|This article is licensed under the GNU Free Documentation License. It uses material from the Wikipedia article "Scanning_voltage_microscopy". A list of authors is available in Wikipedia.|