AI technique 'decodes' microscope images, overcoming fundamental limit
“We’ve given a proof-of-concept and shown how to use AI to significantly improve AFM images, but this work is only the beginning”
12-Mar-2024 -
Atomic force microscopy, or AFM, is a widely used technique that can quantitatively mapmaterial surfaces in three dimensions, but its accuracy is limited by the size of the microscope’sprobe. A new AI technique overcomes this limitation and allows microscopes to resolve material features ...
artificial intelligence
atomic force microscopy
deep learning
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