The inductively coupled plasma optical emission spectrometer (ICP-OES) for highest demands

The Top 3 Advantages

Dual side-on interface adds sensitivity & eliminates contamination/matrix compatibility issues


MultiView: true axial AND true radial (single or dual) plasma observation in one instrument


Best in class performance in the UV/VUV range

The top-of-line SPECTRO ARCOS ICP-OES analyzer evolves elemental analysis to the next level

The SPECTRO ARCOS inductively coupled plasma optical emission spectrometer (ICP-OES) excels in industrial and academic applications for the most advanced elemental analysis of metals, chemicals, petrochemicals, and other materials.

The periscope-free MultiView mechanism lets an operator literally "turn" a radial-view instrument into an axial-view device, or vice-versa, in 90 seconds or less. MultiView now includes dual side-on plasma observation. The two optical interfaces add sensitivity and eliminate contamination/matrix compatibility issues.

Line-array detectors, based on complementary metal-oxide-semiconductor (CMOS) technology, eliminates blooming, reads trace elements’ low signals even in the vicinity of intense matrix lines, offers a high dynamic range, and eliminates on-chip cooling.

The design of the SPECTRO ARCOS ensures exceptionally low operating costs over a long, reliable service life.

  • elemental analysis

  • environmental analysis

  • food analysis

  • fuel analysis


  • agronomy analysis

  • basic material analysis

  • heavy metal analysis

  • raw material analysis

Target Industries
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