Energy dispersive X-ray fluorescence spectrometers:
NEX DE Series
NEX DE Series for High-Performance Elemental and Small-spot Analysis
The Rigaku NEX DE Series are high-performance, direct excitation energy dispersive X-ray fluorescence (EDXRF) spectrometers for rapid, non-destructive qualitative and quantitative elemental analysis. The NEX DE and NEX DE VS measure sodium (Na) through uranium (U) across concentrations ranging from low parts per million to high weight percent levels. Both models accommodate a broad range of sample types, including liquids, solids, alloys, powders, slurries, pastes, coatings, and thin films.
Both NEX DE Series models feature a 60 kV, 12 W X-ray tube, automated single and multilayer tube filters, and a high-throughput silicon drift detector (SDD) supporting count rates above 500,000 counts per second. This combination provides excellent spectral resolution, low limits of detection, and the precision needed for demanding or time-sensitive measurements. The large sample chamber accommodates objects up to 30 cm in diameter and 10 cm tall, while interchangeable automatic sample changers support efficient batch analysis. A tool-free protective safety film helps safeguard the optical components from spills and simplifies routine maintenance.
For applications requiring targeted analysis of small areas, the NEX DE VS adds a high-resolution, backlit camera and automated collimators for 1, 3, and 10 mm spot analysis. Its Point Analysis interface allows operators to position specific areas of a sample for measurement. These capabilities make the NEX DE VS well suited for applications requiring small-spot analysis, including coating measurements on small components, electronic waste screening, foreign material identification, and forensic investigations. The NEX DE provides the same high-performance bulk analysis without the variable small-spot system.
NEX DE Series instruments use QuantEZ software for instrument control, calibration development, routine analysis, and reporting. Its multilingual interface and guided flow bar simplify the creation of empirical and fundamental parameters methods. Optional RPF-SQX software supports semi-quantitative analysis of unknown materials and more advanced quantitative applications. The series addresses applications in exploration, mining, petroleum, cement, metals, polymers, RoHS screening, pharmaceuticals, forensics, education, research, and industrial quality control. Whether used in a laboratory, production facility, or field environment, the NEX DE Series combines analytical performance, flexible sample handling, and straightforward operation.
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Energy dispersive X-ray fluorescence spectrometers: NEX DE Series
NEX DE Series for High-Performance Elemental and Small-spot Analysis