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Scanning Electron Microscopes

Companies Scanning Electron Microscopes

WITec Wissenschaftliche Instrumente und Technologie GmbH, Germany

Manufacturer of high resolution optical and scanning probe microscopy solutions for scientific and industrial applications. A modular product line allows the combination of different microscopy techniques such as Raman, NSOM or AFM in one instrument for flexible analyses of optical, chemical and str more

JEOL (Germany) GmbH, Germany

JEOL offers systems for microscopic imaging with resolutions spanning to the atomic range, and systems for the analysis of chemical compositions in the micro- and nanoscale. The JEOL clientele includes universities and research institutes as well as companies of different size and industrial sectors more

JEOL Ltd., Japan

We are a leading supplier of scanning electron microscopes (SEMs), transmission electron microscopes (TEMs), scanning probe microscopes (SPMs), mass spectrometers, NMR spectrometers, and semiconductor tools for scientific and industrial purposes. We provide applications-specific solutions that advan more

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News Scanning Electron Microscopes

  • Microscopy Today Innovation Award for ZEISS microscope

    ZEISS MultiSEM 505 has been selected by a team of judges from Microscopy Today magazine as a recipient of the 2015 Microscopy Today Innovation Award.As the first multiple-beam scanning electron microscope (SEM) in the world, the system uses 61 beams simultaneously, and offers a capture speed of up t more

  • New microscope sees what others can't

    Microscopes don't exactly lie, but their limitations affect the truths they can tell. For example, scanning electron microscopes (SEMs) simply can't see materials that don't conduct electricity very well, and their high energies can actually damage some types of samples. In an effort to extract a li more

  • Low-resistance connections facilitate multi-walled carbon nanotubes for interconnects

    Using a new method for precisely controlling the deposition of carbon, researchers have demonstrated a technique for connecting multi-walled carbon nanotubes to the metallic pads of integrated circuits without the high interface resistance produced by traditional fabrication techniques.Based on elec more

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Publications Scanning Electron Microscopes

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