FEI's Quanta SEMs and Malvern's Advanced Particle Analysis Software Combine to Deliver Solution for Nanoscale Applications
"As the size of materials used in product development and manufacturing continues to move from the microscale into the nanoscale there is an increasing need for characterization tools that move beyond the limits of light microscopy," commented Matt Harris, FEI's vice president of worldwide marketing and business development. "This combination of FEI and Malvern technologies provides a powerful process and quality control tool for a growing number of nano-enabled products that are moving into production."
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Topic World Particle Analysis
Particle analysis methods allow us to study tiny particles in various materials and reveal their properties. Whether in environmental monitoring, nanotechnology or the pharmaceutical industry, particle analysis gives us a glimpse into a hidden world where we can decipher the composition, size and shape of particles. Experience the fascinating world of particle analysis!
Topic World Particle Analysis
Particle analysis methods allow us to study tiny particles in various materials and reveal their properties. Whether in environmental monitoring, nanotechnology or the pharmaceutical industry, particle analysis gives us a glimpse into a hidden world where we can decipher the composition, size and shape of particles. Experience the fascinating world of particle analysis!