Advancing Materials Research with Confocal Raman Imaging

Confocal Raman microscopy enables detailed and non-destructive analysis of semiconductors, particles or 2D materials. It can reveal chemical or structural properties including material distribution, crystallinity, strain, stress and doping. Correlative photoluminescence investigations give additional information on a semiconductor‘s bandgap. Combined, these analyses are particularly valuable for compound semiconductors, as they often consist of multiple layers and complex structures. Applications for particle analysis can be found in microplastics or pharmaceutical compounds characterization. Researchers in advanced materials development can benefit from comprehensive correlative surface properties analysis. The applications e-book highlights the advantages of the technique and introduces in detail how to gain new insights for advanced materials research applications.