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13 Current news about the topic scanning electron microscopes

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Bruker AXS Wins Prestigious R&D 100 Award For Novel XFlash QUAD Detector for X-ray Microanalysis on Electron Microscopes

28-Jul-2006

Bruker AXS Inc. announced that R&D Magazine has selected its novel XFlash(R) QUAD detector for a 2006 R&D 100 Award. The R&D 100 awards recognize the most technologically significant products introduced into the marketplace during the past year. The XFlash QUAD detector is a key component of ...

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World's smallest universal material testing system

26-Sep-2005

The design, development and manufacturing of revolutionary products such as the automobile, airplane and computer owe a great deal of their success to the large-scale material testing systems (MTS) that have provided engineers and designers with a fundamental understanding of the mechanical ...

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Air Liquide Announces SARIS(TM), a New Balazs(TM) Analytical Service for Solid Materials Characterization

20-Nov-2002

Balazs(TM) Analytical Services, a division of Air Liquide America L.P.'s Electronics business unit, introduces SARIS(TM), a new analytical method for identification of trace- level impurities in solid semiconductor materials. Multi-elemental concentrations are obtained simultaneously, providing a ...

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