FEI Company today introduced the
next generation of its award winning Tecnai TEMs. Carrying the name Tecnai G2,
the new series features the second generation models of the renowned Tecnai
series that was introduced in 1998. Tecnai's All in One concept has made it
possible for both experts and non-experts to utilize the most advanced TEM,
STEM and nano-analysis techniques for semiconductor, data storage, materials
research, and
structural biology applications.
The ultra-high resolution, ease of operation, and faster time to data
delivered by the Tecnai G2 allow customers to make technology shifts more
easily, push research boundaries, and bring new, advanced products and
therapeutics to market in less time.
According to Ben Bormans, FEI's business line manager for TEM and sample
management solutions, "The Tecnai G2 Series allows faster time to data for TEM
analysis in semiconductor and data storage applications, structural biology
and research. Increasingly, time to data is critically important for customers
in these markets as they drive their research and product development and seek
to gain better efficiency."
The advanced Tecnai G2 Series features the Windows(R) 2000 operating
system, automatic aperture control, complete remote control capabilities, and
automatic set-up of optimized parameters for all operating modes. The Tecnai
Imaging and Analysis
software allows automated data-acquisition using advanced
spectrum imaging and tomography techniques.
The new Tecnai G2 series also includes the highly advanced F20 U-Twin
STEM. This tool combines the ultimate resolution in TEM with the ultimate
resolution in STEM to make it possible for conducting sub-nanometer chemical
profiling using advanced Energy Dispersive
x-ray spectroscopy (EDS) and
Electron Energy Loss
spectroscopy (EELS). The F20 U-Twin STEM features an
improved ultra-high resolution objective lens, a new, very high-stability
scanning system, and high-sensitivity electron detection system.
"Atomic Resolution STEM delivers valuable information that's complementary
to TEM," explained Timon Fliervoet, FEI's product manager for materials
research. "STEM gives high-contrast images down to the one Angstrom level and
provides an excellent reference image for chemical analysis. Researchers and
process development engineers need this tool to better characterize the
morphology and
chemistry of gate oxides, catalyst particles, and grain
boundaries in
ceramics. Understanding the characteristics and properties of
advanced, man-made devices and structures requires understanding where
specific types of atoms are located."
Systems in the Tecnai G2 series can be configured for analytical, liquid
helium, tomography, general
Life Science, semiconductor, and life science
applications, among others.
FEI's Tecnai TEMs have received numerous awards worldwide, including the
Good Design Award (G-Mark) from the Japanese Industrial Design Promotion
Organization (JIDPO), and the Product of the Year Award from the Oregon Tech
Awards 2000. Both TEM users and critics have acclaimed the Tecnai as the
roadmap for all future TEMs. More than 250 of the first generation Tecnai's
have been sold since their introduction.