Simultix 15

The Rigaku Simultix 15 combines the elemental analysis resolution of a WDXRF with the analytical speed of an EDXRF, making it ideal for operations processing large numbers of solid, powder, or liquid samples, e.g., in industries such as cement, steel and mineral processing. With all channels scanned simultaneously, delivering uncompromised results, the Simultix 15 is the optimal solution for time-to-result, precision, reliability, low cost –per analysis and instrument longevity.

It also features Rigaku’s unique tube-above optical configuration, which prevents contaminants from landing on the tube or detector, ensuring the most accurate results possible.

Key features

• Elemental Range – Be to U
• High power source – 4 kW (or 3 kW optional)
• Fast analysis – Scan all channels simultaneously.
• Tube-above optical configuration
• Up to 40 fixed channels – Standard 30 fixed channels optionally upgradable to 40
• Automation – Optional Sample Loading Unit provides belt-in feed from third-party sample preparation automation systems.
• Synthetic multilayers, RX-SERIES – New RX85 synthetic multilayer crystals produce about 30% greater intensity than existing multilayers for Be-K and B-K.
• XRD channel – Enables quantitative analysis by XRF and XRD.
• Doubly curved crystals – Applying this option increases signal intensity compared with single curved crystals.
• Improved easy-to-use software – Enhances operability of quantitative condition setting by adopting the same quantitative analysis flow bar used in the ZSX software.
• Heavy and light scanning goniometer – The optional wide elemental range goniometer supports standardless semi-quant (FP) and may be used for qualitative or quantitative determination of non-routine elements.
• Background (B) measurement for trace elements - Optional background measurement for fixed channel, resulting in improved calibration fits and superior accuracy.
• Automatic Pressure Control (APC) – Maintains a constant vacuum level in the optical chamber, dramatically improving light element analysis precision.
• Quantitative scatter ratio method – When this option is utilized in conjunction with the Compton scattering ratio method, for ore and concentrate analysis, theoretical alphas for scattering ratio calibration can be generated.

Fast, Precise XRF Analysis

Suited to the analysis of Be to U in almost any sample matrix, the Simultix 15 scans up to 30 element channels (and optionally up to 40) simultaneously, powered by a 4 kW (or 3 kW optional) source for maximum speed and sensitivity. Coupled with a simple-to-use, intuitive software interface streamlining measurements and analysis, this becomes your ideal partner for high-throughput elemental analysis.

In contrast to most WDXRF instruments, which scan sequentially, the Simultix 15 scans each discrete, optimized fixed channel simultaneously, resulting in significantly faster analyses. The system can be configured to your specific set of elements of interest.

Automatic Sample Changer

For the ultimate in high-throughput XRF analysis, the Simultix 15 can be equipped with a 48-position Automatic Sample Changer (ASC). It can be configured with a right- or left-side belt-in feed, being fed by a third-party automated sample preparation system.

Flexibility

For the ultimate in flexibility, the Simultix 15 can be fitted with a scanning goniometer to measure other elements, as well as XRD for phase analysis.