True Surface Microscopy wins Microscopy Today Innovation Award 2011

Third Consecutive Award

17-Aug-2011 - USA

WITec has just received the microscopy Today Innovation Award for the
development of True Surface Microscopy. Each year, the Microscopy Today magazine selects the best new development in microscopy and presents the award at the US Microscopy and Microanalysis Exhibition and Conference which this year took place in Nashville, TN. True Surface Microscopy allows confocal Raman imaging guided by surface topography. The topographic coordinates measured from an integrated profilometer are used to perfectly follow the sample surface in confocal Raman imaging mode. The result is an image revealing optical or chemical properties at the surface of the sample, even if this surface is very rough or heavily inclined. Previously, True Surface Microscopy received the PITTCON 2011 Editors Gold Award and the R&D 100 Award.


WITec US Managing Director Bob Hirche receives the Microscopy Today Innovation Award 2011 from Microscopy Today Editor in Chief Charles Lyman.

“We’re almost at a loss for words, as the Microscopy Today Innovation Award is the third
honor in the past few months for this technology” says Dr. Joachim Koenen, Managing
Director of WITec. “The continuing public recognition of our innovative spirit underlines the potential of True Surface Microscopy for a wide range of surface science applications.”

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